2026-04-07T03:17:53Z
https://pub.unibl.org/oai
oai:pub.unibl.org:41421
2024-06-12T15:44:28Z
SPICE modeling of oxide and interface trapped charge effects in fully-depleted double-gate FinFETs
/unibl/author/Nebojša Janković
https://www.unibl.org/sr-lat/fis/zaposlen/1120-tatjana-pesic-brdjanin
2015-06
Academic Article
text
851
844
/unibl/sci/idNaucniRad:20376
https://etf.unibl.org
Journal of Computational Electronics
1569-8025
Journal of Computational Electronics
1569-8025
N. Janković, T. Pešić-Brđanin, SPICE modeling of oxide and interface trapped charge effects in fully-depleted double-gate FinFETs, Journal of Computational Electronics, Vol. 14, No. 3, pp. 844 - 851, Jun, 2015