2026-04-07T01:40:38Z https://pub.unibl.org/oai

oai:pub.unibl.org:41421 2024-06-12T15:44:28Z

SPICE modeling of oxide and interface trapped charge effects in fully-depleted double-gate FinFETs /unibl/author/Nebojša Janković https://www.unibl.org/sr-lat/fis/zaposlen/1120-tatjana-pesic-brdjanin 2015-06 Academic Article text 851 844 /unibl/sci/idNaucniRad:20376 https://etf.unibl.org Journal of Computational Electronics 1569-8025 Journal of Computational Electronics 1569-8025 N. Janković, T. Pešić-Brđanin, SPICE modeling of oxide and interface trapped charge effects in fully-depleted double-gate FinFETs, Journal of Computational Electronics, Vol. 14, No. 3, pp. 844 - 851, Jun, 2015 https://pub.unibl.org/s/cir/item/41421