SPICE modeling of oxide and interface trapped charge effects in fully-depleted double-gate FinFETs
Title
SPICE modeling of oxide and interface trapped charge effects in fully-depleted double-gate FinFETs
Identifier
/unibl/sci/idNaucniRad:20376
Type
See all items with this valueAcademic Article
Date
Bibliographic Citation
N. Janković, T. Pešić-Brđanin, SPICE modeling of oxide and interface trapped charge effects in fully-depleted double-gate FinFETs, Journal of Computational Electronics, Vol. 14, No. 3, pp. 844 - 851, Jun, 2015
page start
844
page end
851
Is Part Of
See all items with this valueJournal of Computational Electronics
See all items with this value1569-8025
list of authors
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