SPICE modeling of oxide and interface trapped charge effects in fully-depleted double-gate FinFETs

Title

SPICE modeling of oxide and interface trapped charge effects in fully-depleted double-gate FinFETs

Identifier

/unibl/sci/idNaucniRad:20376

Type

Date

Bibliographic Citation

N. Janković, T. Pešić-Brđanin, SPICE modeling of oxide and interface trapped charge effects in fully-depleted double-gate FinFETs, Journal of Computational Electronics, Vol. 14, No. 3, pp. 844 - 851, Jun, 2015

page start

844

page end

851

Is Part Of

Journal of Computational Electronics

list of authors

Relation

Position: 17563 (40 views)